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LEON3FT proton SEE test results for the solar probe plus program
Author | Pham, Chi; Malcom, Horace; Maurer, Richard; Roth, David; Strohbehn, Kim; |
Keywords | Error correction; Probes; Software testing; Parker Engineering |
Abstract | The Solar Probe Plus program requires a low power microprocessor with demonstrated capability to resist SEE in a high proton flux environment. Proton tests conducted at IUCF successfully demonstrated the single bit error correction capability of the LEON3FT. The test setup and results are summarized. © 2011 IEEE. |
Year of Publication | 2011 |
Journal | IEEE Radiation Effects Data Workshop |
Volume | |
Number of Pages | 118-121 |
Section | |
Date Published | |
ISBN | |
URL | http://dx.doi.org/10.1109/REDW.2010.6062535 |
DOI |